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Center for Integrated Electric Energy Systems FacilitiesMaterials Characterization

Materials Characterization

 

Facilities for characterization of energy-related materials: 

Transmission Electron Microscope (TEM), JEOL JEM 1400 

  • MicroscopeResolution (Lattice Image/ Point Image): 0.20 nm/ 0.38 nm

  • Optimized take-off angle for best peak-to-background ratios and light element detection

  • UPRIGHT CONFOCAL MICROSCOPE, Leica TCS SP8 X

  • Upright Leica DM 6000 with adaptive focus, motorized XY-Stage (15 nm step size) and Super Z Galvo (1500µm/ 3 nm step size)

  • Tandem scanner 8 KHz:

  • Detection range: 400-800 nm

  • Internal detection channels: 2xPMT, 2x HyD

  • Transmitted light detectors: BF (Brightfield) prism for DIC measurement in confocal mode

  • Equipped with Tokai Hit Stage Incubator providing 37˚C and 5% CO2 for live cell imaging

Scanning Probe Microscope with Hysitron Attachment, Bruker Dimension ICON

  • Materials mapping

  • Nanomechanics characterization

  • Nanoelectrical characterization

  • Biological characterization

AMG EVOS FL Microscopy

  • Light cubes: DAPI (Ex 360nm/ Em 447nm), GFP (ex 470 nm/ Em 525 nm), RFP (Ex 530nm/ Em 593 nm), White (for non-transparent samples)

  • Objectives: 4x, 10x, 20x, 40x LWD objectives and 100x coverslip-corrected oil objective

  • Equipped with Bioptechs stage temperature controller providing 37˚C for live cell observation

  • THERMOMECHANICAL CHARACTERIZATION

  • Thermal Gravimetric Analysis (TGA, TA Q50):

  • Temp. range: ambient+5~1000oC

  • Differential Scanning Calorimetry (DSC, TA Q2000):

  • Temp. range:  -90~550 oC

  • Dynamic Mechanical Analysis (DMA, TA Q800):  Temp. range:  -145~600 oC

  • Thermal Conductivity Meter (DTC-300): Temp. range: -20~300 oC;

  • Thermal conductivity range: 0.1~40 W/m.K

Spectroscopic Ellipsometry, Horiba UVISEL FUV

  • Thin film thickness from 1 Å to 30 µm

  • Surface and interface roughness

  • Optical constants (n, k) for isotropic, anisotropic and graded films

  • Characterization of thickness and optical constants in the VIS-FUV spectral range of thin films and multilayer stacks for:

  • Dielectrics

  • High k, low k materials

  • Photo resists

  • Plastics

  • Amorphous semiconductors

  • Thin metal films

  • Glass

  • Polymers

TEM Sample Preparation

  • Leica EM UC7 with Cryo Attachment

  • High quality ultra-microtome for precise room temperature and cryo sectioning (-15~ -185˚C)

Thermo Scientific Nicolet iS50 FTIR Spectrometer

FTIR SpectrometerThe Nicolet iS50 FTIR Spectrometer is dual source-capable, offering users both the Polaris long-life IR source and a tungsten-halogen white light source. Full support for a wide range of accessories offers the flexibility needed to target the spectral analysis.

Colloidal Dynamics ZetaProbe Analyzer

ZetaProbe AnalyzerThe ZetaProbe features a compact design with built-in titration, versatile dip probe sensor, and software wizards. Automatic titration offers unattended rapid isoelectric point determination, as well as optimum dispersant or flocculant level control in a click of a button. The ZetaProbe offers many advances not found in other analyzers including automatic correction for particle size and double layer distortion.

Quantachrome – BET Surface Area and Pore Size Analyzer

Pore Size AnalyzerBrunauer-Emmett-Teller (BET) surface area analysis is the multi-point measurement of an analyte’s specific surface area (m2/g) through gas adsorption analysis, where an inert gas such as nitrogen is continuously flowed over a solid sample, or the solid sample is suspended in a defined gaseous volume. Small gas molecules adsorb to the solid substrate and its porous structures due to weak van der Waals forces, forming a monolayer of adsorbed gas. This monomolecular layer, and the rate of adsorption, can be used to calculate the specific surface area of a solid sample and its porous geometry.

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